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Found: 27      Displaying: 11 - 20
#
Part:
Description:
Manuf.
Package
Pins
T°min
T°max
PDF size
11.
Datasheet AD7834AN0.3-7V; 450mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumentation
AD
DIP
28
-40°C
85°C
361K
12.
Datasheet AD7834AR0.3-7V; 450mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumentation
AD
SOIC
28
-40°C
85°C
361K
13.
Datasheet AD7834BR0.3-7V; 450mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumentation
AD
SOIC
28
-40°C
85°C
361K
14.
Datasheet AD7837AN0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction
AD
DIP
24
-40°C
85°C
198K
15.
Datasheet AD7837AQ0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction
AD
CERDIP
24
-40°C
85°C
198K
16.
Datasheet AD7837AR0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction
AD
SOIC
24
-40°C
85°C
198K
17.
Datasheet AD7837BN0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction
AD
DIP
24
-40°C
85°C
198K
18.
Datasheet AD7837BQ0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction
AD
CERDIP
24
-40°C
85°C
198K
19.
Datasheet AD7837BR0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction
AD
SOIC
24
-40°C
85°C
198K
20.
Datasheet AD7837SQ0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction
AD
CERDIP
24
-40°C
85°C
198K
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