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# | Part: | Description: | Manuf. | Package | Pins | T°min | T°max | PDF size |
1. | GMS82512 | 8-BIT SINGLE-CHIP MICROCONTROLLERS | Hynix Semiconductor | HYNIX | - | - | - | 1.24 Mb |
2. | GMS82512 | 8-BIT SINGLE-CHIP MICROCONTROLLERS | Hynix Semiconductor | HYNIX | - | - | - | 799 Kb |
3. | 0740582512 | 2.00mm (.079") Pitch VHDM^ Board-to-Board Backplane Header, Vertical, 6-Row, PinEnd Version, 150 Circuits, Pin Length 6.25mm (.246") | Molex Electronics Ltd. | MOLEX | - | - | - | 298 Kb |
4. | 0751982512 | 2.00mm (.079") Pitch 8-Row VHDM^ Lite Backplane Header, Guide Pin Signal Module,Pin End Version, 200 Circuits, Pin Length 6.25mm (.246") | Molex Electronics Ltd. | MOLEX | - | - | - | 313 Kb |
5. | SN54LVT182512 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 581 Kb |
6. | SN74LVT182512 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 581 Kb |
7. | SN54LVTH182512 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 563 Kb |
8. | SN54LVTH182512 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 705 Kb |
9. | SN74LVTH182512 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 705 Kb |
10. | SN74LVTH182512 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 563 Kb |
11. | SN74LVTH182512-EP | 3.3-V ABT 16-BIT REGISTERED TRANSCEIVER WITH 3-STATE OUTPUTS | Texas Instruments | TI | - | - | - | 305 Kb |
12. | 7448251201 | COMMON MODE CHOKE WE-CMB | Wurth Elektronik GmbH & Co. KG, Germany. | WURTH | - | - | - | 122 Kb |
13. | MAL215825123E3 | Aluminum Capacitors Power Ultra Long Life Snap-In | Vishay Siliconix | VISHAY | - | - | - | 122 Kb |
14. | SN74LVT182512DGG | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 581 Kb |
15. | SN74LVTH182512DGG | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 563 Kb |
16. | SN74LVTH182512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 563 Kb |
17. | SN74LVTH182512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 705 Kb |
18. | 74LVTH182512DGGRE4 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 563 Kb |
19. | 74LVTH182512DGGRE4 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 705 Kb |
20. | 74LVTH182512DGGRG4 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 705 Kb |