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| # | Part: | Description: | Manuf. | Package | Pins | T°min | T°max | PDF size |
| 1. |  HM62G18512 | 8M Synchronous Fast Static RAM(512k-word x 18-bit) | Hitachi Semiconductor | HITACHI | - | - | - | 145 Kb |
| 2. | SN54LVT18512 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 581 Kb |
| 3. | SN74LVT18512 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 581 Kb |
| 4. | SN54LVTH18512 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 563 Kb |
| 5. | SN54LVTH18512 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 705 Kb |
| 6. | SN74LVTH18512 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 563 Kb |
| 7. | SN74LVTH18512 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 705 Kb |
| 8. | 0185120000 | SAKG 28 III SAKG 32 II SAKG 32 III SAKG 32 II G SAKG 32 I SAKG 28 II G | Weidmuller | WEIDMULLER | - | - | - | 475 Kb |
| 9. | 0185120000 | SAK-series | Weidmuller | WEIDMULLER | - | - | - | 1.87 Mb |
| 10. | HM62G18512BP-4 | 8M Synchronous Fast Static RAM(512k-word x 18-bit) | Hitachi Semiconductor | HITACHI | - | - | - | 145 Kb |
| 11. | HM62G18512BP-5 | 8M Synchronous Fast Static RAM(512k-word x 18-bit) | Hitachi Semiconductor | HITACHI | - | - | - | 145 Kb |
| 12. | SN74LVT18512DGG | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 581 Kb |
| 13. | SN74LVTH18512DGG | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 563 Kb |
| 14. | SN74LVT18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 581 Kb |
| 15. | SN74LVTH18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 563 Kb |
| 16. | SN74LVTH18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 705 Kb |
| 17. | 74LVT18512DGGRE4 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 581 Kb |
| 18. | 74LVTH18512DGGRE4 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 705 Kb |
| 19. | 74LVTH18512DGGRE4 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 563 Kb |
| 20. | 74LVTH18512DGGRG4 | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas Instruments | TI | - | - | - | 705 Kb |
